APPLICATIONS Orientation measurements Crystal face ( wafer, blank, block, bar...) Ingot flat Wafer flat and wafer notch Seed axis of round or square seeds Orientation processes Flat orientation on medium size OD ground ingots. Crystal face. VERSIONS & CONFIGURATIONS Capacities For loads up to 10 kg and 25 kg Special version for loads up to 100kg Dual stations with mixed versions Double diffraction option
Holder for wafer flat orientation measurement
Measurement of crystals with tilted planes.
Holder for seed orientation measurement.
Orientation process of ingot flat.
GM Series X-Ray Goniometers
CRYSTAL PLANE ORIENTATION MEASUREMENTS
DIGITAL ANGLE DISPLAY Display options Decimal : resolution 0,01 - 0,001 Degrees, minutes, seconds : 1 or 5 sec. PC & software : - standard or customized software. - storage of mesured data. All display versions enable reset to zero at any position. Absolutes or relative angle values can be alternatively displayed. Automatic recalibration. RANGE OF OPERATIONS Goniometer rotation range : -10° to 110°, with fast/ coarse and slow/fine rotation range. Detector setting range : -10° to 110° with indexed positions (option) PERFORMANCE Measurement accuracy : +/- 0,005° to +/- 0,02° depending of crystal type, plane and surface condition. With double diffraction : +/- 2 seconds to +/-15 seconds. X-Ray generator Output voltage : 30 kV-DC Max. rating : 30mA
The GM Series X-ray measurement systems are general purpose heavy duty production units especially designed for measuring the orientation of crystal products with respect to a selected crystallographic plane. Orientation processes of small to medium size crystals can be performed with the help of dedicated holders and jigs. All single crystal can be processed, for all applications such as semi conductors, opto-electronics, optics, etc..
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